Application of SSRM

The Adama Innovations probe AD-40-AS probe shows excellent properties for SSRM analysis of doped silicon samples including low tip resistance and long-term stability. The dopant profile observed with the Adama probe is homogeneous whereas it is discontinuous and therefore misleading when using other commercial diamond probes. The Adama probes have been successfully used for over 400 SSRM scans.

(Data source: Professor Hartmut Bracht, Institute of Materials Physics, University of Muenster)