Applicaiton of PeakForce KPFM

A 7.5 x 3.5 µm PeakForce KPFM scan of graohene folds on a silicon substrate. A bright vertical band highlighted by the arrow is visible in both the adhesion (Middle) and surface potential (Bottom) images but not in topography (Top). The higher surface potential may be attributed to weaker bonding between the graphene and the substrate in this region contributing to a change in dielectric constant.

(Data source: Georg Duesberg, Trinity College Dublin)