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PMCL-AC160TS

Reflex side aluminum coating
Resonance Frequency (F): 300 kHz Spring Constant (K): 26 N/m

New Concept Chip
- Medium And Stiffer Middle Silicon Probe

 

Model Coating Metal (Tip side / Reflex)
PMCL-AC160TS Non / Al
PARAMETER PMCL-AC160TS
Cantilever Shape Rectangular
Dimensions (LxWxT, µm) 160 x 40 x 3.7
Resonance frequency (kHz) 300 (±100)
Spring constant (N/m) 26 (typ.)
Material Silicon (n-type, 0.01 – 0.02 Ω·cm)
Tip Shape Sharpened tetrahedral, 'Tip View'
Tip radius (nm) 7 (typ.)
Angles (F / B / S) 0° / 35° / 9° or less
Material Silicon (n-type, 0.1 – 0.4 Ω·cm)
Chip Dimensions (mm) 3.4 x 1.6 x 0.3
Box Configuration Pre-separated / Tacky coating box

Outstanding Features of New Tetrahedral Cantilever

Application for various sample surfaces :

The mid-range mechanical properties [resonance frequency : 150 kHz, spring constant : 9 N/m (typ.)] mean that the PMCL-AC200TS is tailored to any surface from soft to hard.
The stiffer middle mechanical properties [resonance frequency: 300 kHz, spring constant : 26 N/m] means that PMCL-AC160TS is redesigned for revealing sample surface precisely and gently.

Doped silicon cantilever :

The cantilever is made from silicon with a low surface resistance of 0.1 – 0.4 Ω・cm.
This means 1/20 resistance of our conventional cantilevers.

 

Tip

Below are SEM images of a Tetra tip from the front and side, and the last is a magnified view from side.

Front
Front
Side
Side
Front (probe apex)
Front ( probe apex )

Tip shape : sharpened tetrahedral ( tilted )
It shows good symmetry viewed from the front and is inclined viewed from the side.

Dimension of Levers and Chip (Substrates)

Dimension overview
Lever design
Chip details

Metal Coating

[ Reflex coating ]

Thin aluminum film with the thickness of 100 nm is coated on the cantilever for reflecting light from the deflection sensor in the AFM equipment. High reflex for high S/N sensing can be expected.

 

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