NSC18/AL BS

Detector aluminum coating
Resonance Frequency (F): 75 kHz Spring Constant (K): 2.8 N/m

Cantilevers of the 17 series with low spring constant are used mostly in contact mode AFM. It is possible to adjust the scanning parameters to minimize the tip-sample force. Imaging in tapping mode gives the true topography of soft samples.

  • Typical probe tip radius of uncoated tip: 8nm
  • Full tip cone angle: 40°
  • Total tip height: 12 - 18 µm
  • Probe material: n-type Silicon
  • Probe bulk resistivity: 0.01 - 0.025 Ohm*cm
  • Detector coating: Aluminum

CANTILEVER

SEM image of tetrahedral tip cantilever (OMCL-AC160TS-)

SEM image of the cantilever

SEM image of tetrahedral tip cantilever (OMCL-AC160TS-)

Schematic drawing of the cantilever

Cantilever Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
Width
w ± 3,
Thickness
t ± 0.5,
  min typ max min typ max µm µm µm
18 Series 60 75 90 1.2 2.8 5.5 225 27.5 3.0

*The full cone angle may be less than 40° at the last 200 nm of the tip end.

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