General-Purpose-Probe-tip-close-up-NSC17AlBS

NSC17/AL BS

  • Cantilevers of the 17 series with low spring constant are used mostly in contact mode AFM.
    It is possible to adjust the scanning parameters to minimize the tip-sample force.
    Imaging in tapping mode gives the true topography of soft samples.
  • 8 nm
  • 40°
  • 12 – 18 µm
  • n-type silicon
  • 0.01 – 0.025 Ohm*cm
  • Aluminum
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商品說明

CANTILEVER

*The full cone angle may be less than 40° at the last 200 nm of the tip end.

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