General-Purpose-Probe-tip-close-up-20121023021039

NSC14/AL BS

  • Cantilevers of the 14 series are generally used in tapping mode for imaging relatively soft samples
    to obtain better phase contrast and reduce surface deformations caused by tip tapping. Probes with coatings can also be used in conductive AFM techniques.
  • 8 nm
  • 40°
  • 12 – 18 µm
  • n-type silicon
  • 0.01 – 0.025 Ohm*cm
  • Aluminum
分類: ,

商品說明

CANTILEVER

 

Cantilever Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm
Width
w ± 3,
µm
Thickness
t ± 0.5,
µm
min typ max min typ max
14 Series 110 160 220 1.8 5 13 125 25 2.1
*The full cone angle may be less than 40° at the last 200 nm of the tip end.

 

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