AFM Probe Model: Tap300-G

afm-tap300-g

AFM Probe Model: Tap300-G

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商品說明

AFM probe Model Tap300

AFM Probe Model: Tap300-G
  application: Tapping Mode,
Intermittent Contact Mode
  general: Rotated Monolithic silicon probe
Symmetric tip shape
Chipsize 3.4 x 1.6 x 0.3 mm
Alignment Grooves
  coating: none [Al Reflex – optional]
  technical
data:		 Resonant Frequency – 300 kHz
Force Constant – 40 N/m
value range
Resonant Frequency 300 kHz ± 100 kHz
Force Constant 40 N/m 20 N/m to 75 N/m
Length 125 µm ± 10 µm
Mean Width 30 µm ± 5 µm
Thickness 4 µm ± 1 µm
Tip Height 17 µm ± 2 µm
Tip Set back 15 µm ± 5 µm
Tip Radius < 10 nm
Reflex Coating none
Half Cone Angle 20°-25° along cantilever axis
25°-30° from side
10° at the apex

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